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3D ICThe Future Of Semiconductor Design Author: Siemens Digital Industries Software
As the semiconductor industry struggles with the limits of Moores Law, traditional monolithic scaling is no longer enough to meet performance, power, area and cost demands in technology, design, analysis, and manufacturing. 3D IC by Siemens is your go-to podcast for exploring the cutting-edge world of 3D IC packaginga revolutionary approach reshaping semiconductor design, system integration, and heterogeneous computing. Join industry leaders, engineers, and innovators as we break down advanced IC packaging solutions like 2.5D/3D IC, FCBGA, FOWLP, and more. Discover how chiplets, multi-die integration, and high-bandwidth memory (HBM) are driving higher performance, lower power consumption, and scalable architectures. In each episode, we dive deep into the challenges and opportunities of IC design and manufacturing, including: Roadmap for advanced packaging and heterogeneous integration in semiconductor scaling Mainstream adoption of 3D ICkey challenges and breakthroughs Optimizing micro-architecture and integration platforms for performance and efficiency Strategic planning of chiplets and interposers for hierarchical device integration Leveraging early predictive multi-physics analysis to enhance design accuracy Automating design and routing for RDL-based fan-out wafer-level packaging (FOWLP) Exploring glass substrates for superior electrical and thermal performance Developing test-vehicles and daisy chain designs for architectural validation Ensuring reliability and manufacturability in 3D IC heterogeneous integration Mastering Signal Integrity (SI) and Power Integrity (PI) Analysis for high-speed systems Managing thermal challenges in stacked die architectures Subscribe now and stay ahead in the world of 3D IC. Learn more: Siemens 3D IC Packaging Solutions Language: en Contact email: Get it Feed URL: Get it iTunes ID: Get it |
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3D IC is Here—But Is Your Architecture Ready for It?
Thursday, 29 May, 2025
As 3DIC adoption ramps up, it’s becoming clear: microarchitecture needs a rethink. So how do you design hardware that can survive and thrive in the new era of stacked silicon? In this episode of the Siemens 3D IC Podcast, host John McMillan speaks with Pratyush Kamal, Director of R&D for 3D IC Solutions Engineering at Siemens Digital Industries. With decades of experience spanning Qualcomm and Google, Pratyush brings deep insight into the evolution of IC design—and how 3D integration is transforming every layer of the design stack. From redefining how and when microarchitecture decisions are made to overcoming the thermal, testing, and failure analysis challenges that come with 3D stacking, this episode dives into the critical topics design teams need to understand today. You’ll also hear how AI, automation, and cross-disciplinary expertise are reshaping team roles—and why software-defined silicon is redefining the design process itself. This episode is essential listening for IC architects, system designers, and packaging engineers navigating the transition to advanced 3D IC platforms. What You’ll Learn in this Episode: What is microarchitecture in IC design? (2:30) What does microarchitecture mean in 3D IC design? (3:20) How early do we need to consider microarchitecture in 3D IC design? (4:45) The main issues system designers face concerning the increasing complexity of microarchitecture (5:50) How are roles changing to enable a more holistic outlook on 3D IC microarchitecture? (9:15) What would enable non-silo design practice? (11:00) Closing thoughts (11:55) Connect with John McMillan LinkedIn Website Connect with Pratyush Kamal LinkedIn Website Explore More on 3D IC Innovation & Research: Deepen your understanding of 3D IC design with these valuable resources: Home | UCIe Consortium Die Stacking (3D) Microarchitecture | IEEE Conference Publication | IEEE Xplore Fine grain 3D integration for microarchitecture design through cube packing exploration | IEEE Conference Publication | IEEE Xplore Opportunities, Challenges and Mitigations in 3DIC Design, Test, and Analyses | IEEE Conference Publication | IEEE Xplore Design-Aware Partitioning-Based 3-D IC Design Flow With 2-D Commercial Tools | IEEE Journals & Magazine | IEEE Xplore
